产品目录

品牌简介

菲希尔

德国菲希尔公司Fischer测量技术--在测量技术领域内领航高质量水准的FISCHER仪器是多年的工业领域经验积累，广泛的科研及与有名望的合伙人合作的结果。FISCHER是可靠的和胜任的合作伙伴，能提供正确的建议，广泛的服务和应用培训研讨会。今天，FISCHER仪器已成功应用于工业，科研及所有的工程领域。

>>品牌详情

推荐产品

热销产品

X-RAY XDV-SD X射线荧光光谱仪

2009/9/23 11:06:43 阅读：956次

加入购物车

加入对比

产品系列名称：X-RAY XDV-SD X射线荧光光谱仪
产品定货号：MC-28032-00

产地：德国
品牌：菲希尔
推荐：

FISCHERSCOPE X-RAY XDV-SD X射线荧光光谱仪

技术参数

	FISCHERSCOPE^® X-RAY XAN^®	FISCHERSCOPE^® X-RAY XDAL	FISCHERSCOPE^® X-RAY XDV^®-SD
测量方向	从下到上	从上到下	从上到下
X射线管为微聚焦管，带铍窗口
高压可调：10kV；30kV；50 kV
开槽测量室
准直器个数：4
Z轴	无	可编程	可编程
测试台类型	固定工作台	可编程XY工作台	可编程XY工作台
测试点放大倍数	34 －184倍	20 －180倍	20 －180倍
WinFTM^® 版本	V6：基本型，带PDM WinFTM^® Super可选	V6：基本型，带PDM WinFTM^® Super可选	V6：基本型，带PDM WinFTM^® Super可选
操作系统：Windows^® XP专业版
Amount of primary filters	2	2	6
Digital pulse processor	optional		standard

Description：

Are your products RoHS-compliant?
Are you receiving the amount of gold that you paid for?
Is your electroplating process cost-effective and yet still reliable?

If you are unsure on any of these questions, then the FISCHERSCOPE^® X-RAY XDV^®-SD is your right choice!

This instrument was especially developed for the challenging tasks of RoHS/ WEEE analyses.
Furthermore, it is ideally suited for measurements of gold and other precious metals with a repeatability of gold analyses of up to 0,5 ?
For coatings: Not only their consistence can be measured, but also their thickness!

The FISCHERSCOPE^® X-RAY XDV^®-SD is a really versatile alround-talent!

RoHS / WEEE

Very reliable measurement of Pb, Hg, Cd, Br and Cr. The achievable detection limits are 2 ppm for Pb, and 10 ppm for Cd in plastics material.
The RoHS / WEEE limit values of 1000 ppm (Pb) and 100 ppm (Cd) can be verified reliably.
Plastic samples can be analyzed correctly regardless of their thickness.
Even small electronic components or coating systems on printed conductors are analyzed with pin-point precision.

The XY(Z) stage allows for automatic scanning of pc-boards, for example.

The Software WinFTM^® V.6 BASIC

Up to 24 individual characteristic values of a sample with regard to coating thickness and element concentration can be determined simultaneously during one measurement.
Very thin coatings down into the 10-nanometer range can be measured.
Most often, complex multi-coating systems can be analyzed standard-free (without calibration) with great accuracy.
The measurement accuracy can be raised to a maximum by using up to 64 calibration standards per application.
This also ensures the traceability of the measurement results.
DKD calibration certificates according to DIN EN ISO/IEC 17025 can be issued for many X-RAY calibration standards.

The WinFTM^® V.6 software enables very accurate results for materials analysis over a concentration range from a few ppm to 100 %.