CMI243CMI243涂层测厚仪
添加时间：2010-5-28 16:09:50 担当：未知 阅读：次
- 产品名称：CMI243CMI243涂层测厚仪
- 定货号：GD-00333-00
CMI243 measures coating thickness measurement for conductive coatings over conductive substrates.
The CMI243 package enables control of plating coating processes using advanced eddy-current technology. It provides non-destructive coating thickness measurement for conductive coatings over conductive substrates.
The system is specially designed to handle the needs of platers, coaters, and quality professionals. The standard package consists of a control unit, an ECP-m eddy current probe and a set of Zn on Steel NIST traceable calibration standards. The ECP-m probe is specifically tailored for metallic coatings on metallic substrates such as Zn on Steel.
定货信息：
| 定货号
| 产品名称
| 规格配置
| 价格
|
| GD-00333-00 | 涂层测厚仪 | 标准配置或电话咨询010-84851836 | 咨询 |
泰亚赛福 —— 世界领先的检测仪器集成供应商 
您当前的位置：
