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订货号: | MM-01373-00 |
产地: | 美国 |
品牌: | |
开发编号: | N |
市场价: | ¥ |
*此产品根据配置不同价格不同 |
*此价格为参考价格,具体价格以订单合同为准 |
|
520C |
510A |
IN-CIRCUIT TEST | ||
GOOD/BAD TEST |
PNP and NPN transistors
FET’s, SCR’s | |
IDENTIFIES |
NPN or PNP
FET as N-channel or P-channel
Silicone or germanium transistors
transistors in LO drive, base lead in HI drive all leads of SCR |
NPN or PNP
FET as N-channel or P-channel
FET-gate lead, all leads of |
OUT-OF-CIRCUIT TEST | ||
GOOD/BAD TEST |
PNP and NPN transistors
FET’s, SCR’s |
PNP and NPN transistors
FET’s |
IDENTIFIES |
NPN or PNP
FET as N-channel or P-channel
Silicone or germanium transistors |
NPN or PNP
FET as N-channel or P-channel |
MEASURES |
Reverse leakage from 0.1mA to 9mA |
Does not apply |
AUTOMATIC INDICATORS | ||
AUDIBLE TONE |
GOOD |
Does not apply |
LED |
NPN or PNP, Ge or Si |
NPN or PNP, Ge or Si |
TEST SWITCH |
Base or Gate for good transist or FET’s |
Base or Gate for good transistor or FET’s |
METER SCALES |
Readable from 0.1μA to 9mA
for Ice leakage, calibrated for silicon and germanium power and signal transistor leakage limits |
Does not apply |
APPLIED TEST CURRENTS | ||
BASE DRIVE* |
250mA (HI), 1mA (LO) | |
COLLECTOR* |
125mA | |
TEST REPETITION |
10Hz |
5Hz |
IN-CIRCUIT SHUNT LIMIT FOR VALID GOOD/BAD TEST | ||
RESISTANCE |
>10Ω (HI), 1.5kΩ (LO) | |
CAPACITANCE |
<15mF (HI), 0.3mF (LO) |
<25mF (HI), 0.3μF (LO) |
GENERAL | ||
POWER REQUIREMENT |
9V Battery (Supplied) or optional AC adaptor |
6VDC from 4 “AA” batteries(not supplied) |
OPERATING TEMP |
32° to 104°F (0° to 40°C), <75% RH | |
DIMENSIONS(HxWxD) |
7.5 x 4.0 x 2.0"(191 x 102 x 51 mm) | |
WEIGHT |
1 lb. (450g) |
定货号 | 产品名称 | 规格配置 / 简介 | 市场价/(会员价) |
---|---|---|---|
MM-01373-00 | Model510A便携式晶体管测试仪 | /() |