产品描述:
FISCHERSCOPE X-RAY XDV-SD X射线荧光光谱仪
技术参数
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FISCHERSCOPE® X-RAY XAN® |
FISCHERSCOPE® X-RAY XDAL |
FISCHERSCOPE®
X-RAY XDV®-SD |
测量方向 |
从下到上 |
从上到下 |
从上到下 |
X射线管为微聚焦管,带铍窗口 |
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高压可调:10kV;30kV;50 kV |
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开槽测量室 |
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准直器个数:4 |
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Z轴 |
无 |
可编程 |
可编程 |
测试台类型 |
固定工作台 |
可编程XY工作台 |
可编程XY工作台 |
测试点放大倍数 |
34 -184倍 |
20 -180倍 |
20 -180倍 |
WinFTM® 版本 |
V6:基本型,带PDM WinFTM® Super可选 |
V6:基本型,带PDM WinFTM® Super可选 |
V6:基本型,带PDM WinFTM® Super可选 |
操作系统:Windows® XP专业版 |
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Amount of primary filters |
2 |
2 |
6 |
Digital pulse processor |
optional |
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standard |
Description:
- Are your products RoHS-compliant?
- Are you receiving the amount of gold that you paid for?
- Is your electroplating process cost-effective and yet still reliable?
If you are unsure on any of these questions, then the FISCHERSCOPE® X-RAY XDV®-SD is your right choice!
This instrument was especially developed for the challenging tasks of RoHS/ WEEE analyses.
Furthermore, it is ideally suited for measurements of gold and other precious metals with a repeatability of gold analyses of up to 0,5 ?
For coatings: Not only their consistence can be measured, but also their thickness!
The FISCHERSCOPE® X-RAY XDV®-SD is a really versatile alround-talent!
RoHS / WEEE
- Very reliable measurement of Pb, Hg, Cd, Br and Cr. The achievable detection limits are 2 ppm for Pb, and 10 ppm for Cd in plastics material.
- The RoHS / WEEE limit values of 1000 ppm (Pb) and 100 ppm (Cd) can be verified reliably.
- Plastic samples can be analyzed correctly regardless of their thickness.
- Even small electronic components or coating systems on printed conductors are analyzed with pin-point precision.
The XY(Z) stage allows for automatic scanning of pc-boards, for example.
The Software WinFTM® V.6 BASIC
- Up to 24 individual characteristic values of a sample with regard to coating thickness and element concentration can be determined simultaneously during one measurement.
- Very thin coatings down into the 10-nanometer range can be measured.
- Most often, complex multi-coating systems can be analyzed standard-free (without calibration) with great accuracy.
- The measurement accuracy can be raised to a maximum by using up to 64 calibration standards per application.
- This also ensures the traceability of the measurement results.
- DKD calibration certificates according to DIN EN ISO/IEC 17025 can be issued for many X-RAY calibration standards.
The WinFTM® V.6 software enables very accurate results for materials analysis over a concentration range from a few ppm to 100 %.
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注意:本产品唯一个人现金委托收款人,如汇入其它个人账户本公司不承担任何责任
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