X-RAY XDV-SD X射线荧光光谱仪
添加时间：2009-9-23 编辑：泰亚赛福 阅读：次
- 产品名称：X-RAY XDV-SD X射线荧光光谱仪
- 产品定货号：MC-28032-00
FISCHERSCOPE X-RAY XDV-SD X射线荧光光谱仪
技术参数
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FISCHERSCOPE®
X-RAY XAN® |
FISCHERSCOPE®
X-RAY XDAL |
FISCHERSCOPE®
X-RAY XDV®-SD |
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测量方向 |
从下到上 |
从上到下 |
从上到下 |
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X射线管为微聚焦管，带铍窗口 |
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高压可调：10kV；30kV；50 kV |
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开槽测量室 |
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准直器个数：4 |
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Z轴 |
无 |
可编程 |
可编程 |
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测试台类型 |
固定工作台 |
可编程XY工作台 |
可编程XY工作台 |
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测试点放大倍数 |
34 －184倍 |
20 －180倍 |
20 －180倍 |
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WinFTM® 版本 |
V6：基本型，带PDM
WinFTM® Super可选 |
V6：基本型，带PDM
WinFTM® Super可选 |
V6：基本型，带PDM
WinFTM® Super可选 |
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操作系统：Windows® XP专业版 |
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Amount of primary filters |
2 |
2 |
6 |
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Digital pulse processor |
optional |
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standard |
Description：
- Are your products RoHS-compliant?
- Are you receiving the amount of gold that you paid for?
- Is your electroplating process cost-effective and yet still reliable?
If you are unsure on any of these questions, then the FISCHERSCOPE® X-RAY XDV®-SD is your right choice!
This instrument was especially developed for the challenging tasks of RoHS/ WEEE analyses.
Furthermore, it is ideally suited for measurements of gold and other precious metals with a repeatability of gold analyses of up to 0,5 ?
For coatings: Not only their consistence can be measured, but also their thickness!
The FISCHERSCOPE® X-RAY XDV®-SD is a really versatile alround-talent!
RoHS / WEEE
- Very reliable measurement of Pb, Hg, Cd, Br and Cr. The achievable detection limits are 2 ppm for Pb, and 10 ppm for Cd in plastics material.
- The RoHS / WEEE limit values of 1000 ppm (Pb) and 100 ppm (Cd) can be verified reliably.
- Plastic samples can be analyzed correctly regardless of their thickness.
- Even small electronic components or coating systems on printed conductors are analyzed with pin-point precision.
The XY(Z) stage allows for automatic scanning of pc-boards, for example.
The Software WinFTM® V.6 BASIC
- Up to 24 individual characteristic values of a sample with regard to coating thickness and element concentration can be determined simultaneously during one measurement.
- Very thin coatings down into the 10-nanometer range can be measured.
- Most often, complex multi-coating systems can be analyzed standard-free (without calibration) with great accuracy.
- The measurement accuracy can be raised to a maximum by using up to 64 calibration standards per application.
- This also ensures the traceability of the measurement results.
- DKD calibration certificates according to DIN EN ISO/IEC 17025 can be issued for many X-RAY calibration standards.
The WinFTM® V.6 software enables very accurate results for materials analysis over a concentration range from a few ppm to 100 %.
泰亚赛福 —— 世界领先的检测仪器集成供应商 
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