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吉时利

吉时利仪器公司为全球专业的电子制造商提供高准确度的用于产品测试、过程监控、产品发展和研究的各种测量解决方案。吉时利公司大约拥有500多种产品，分别用于：能源、测量、连接、控制或DC通信和光电信号。吉时利可以提供完整的包括仪器和主机插板的解决方案，既可作为系统的一个组件，也能作为独立的解决方案。吉时利的客户多是制造、产品更新和研究领域的工程师、技术人员和科学家。

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4200-FLASH型非易失性存储器测试选件

2009/11/10 17:05:19 阅读：619次

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产品系列名称：4200-FLASH型非易失性存储器测试选件
产品定货号：ME-00872-00

产地：美国
品牌：吉时利
推荐：

The Model 4200-FLASH package will test single FLASH memory cells or small arrays quickly and easily. This package takes advantage of many of the new features added to the Model 4205-PG2 and includes all the necessary code and the interconnect needed to perform a standard set of Flash memory tests for NAND or NOR technologies, with higher pulse voltages important for MLC technologies. The tests included generate program and/or erase cycles using an easy interface to the patent-pending Segment ARB pulse mode as well as controlling the in-line High Endurance Output Relay. Endurance and Disturb tests are also a snap using the included test code and the long-life Output Relay.

The FLASH package provides an easy-to-understand solution right out of the box and offers easy access to the pulse generators for general purpose pulse applications.

应用

Four channels of multi-level pulse:

±40V pulsing into high impedance pin (±20V into 50Ω)

High Endurance Output Relay provides fast open/close for pin isolation during erase pulse

Pulse Widths: 200ns to 1s.

Up to 25 pulse levels (100 pulse segments)

Included tests:

Endurance

Program-read

Erase-read

Disturb